Dr. Ashok Kumar Suhag earned his doctorate from Gautam Buddha University in the area of Design for the testability (DFT) specifically on the scan architectures and low power test methodologies. He received his M.Tech in Microelectronics and VLSI design from Kurukshetra University, Kurukshetra and B.E. in Electronics Instrumentation and Control Engineering from the University of Rajasthan.
He has experience of around eleven years in teaching and research. Prior to joining BMU, he was working at Gautam Buddha University, Greater Noida. He was also previously associated with VIT Jaipur, MEC Bikaner and with a research lab of CSIR that is CSIR- Central Electronics Engineering Research Institute (CEERI) Pilani as a Project Assistant where he worked in the area of MEMS particularly on the fabrication of micro-hotplate.
His research interests are VLSI testing and design for testability, SoC/NoC design and test & self-healing system design. He has published 15 scholarly articles in various international journals and conferences of repute such as the International Journal of electronics, International journal of circuits and architecture Design, International journal of system assurance engineering and management, vacuum, WRTLT, RASDAT, ISED. He has been an active participant and reviewer for international journals and conferences such as the international journal of electronics, RASDAT, IEEE International Conference on Computer Communication and Control. He is also a lifetime member of the International Association of Engineers and Indian Society for Technical Education and IEEE. Apart from the research and work, his interests include playing cricket, badminton, volleyball, listening to music, travelling and exploring the horizons of traditional Indian culture.
